XRD works by irradiating a material with incident X-rays and then measuring the intensities and scattering angles of the X-rays that leave the material 1. Grain and pore growth obeys the same kinetic relation, so that the microstructure grows by simple enlargement while its morphology is static. X-ray diffraction analysis (XRD) is a technique used in materials science to determine the crystallographic structure of a material. The inset shows the enlarged diffraction peak of (110) of the two samples. For higher temperatures, a continuous coagulation of the crystallites occurs, leading to grain growth. XRD patterns of the SnO 2 samples: (a) nanorods (b) nanoparticles. It is due to fissure formation in the xerogel network. Between 110 and 250☌, the dehydratation reaction leads to an amorphization evidenced by a decrease of the long and short range crystallographic order. For the desiccated gel (110☌), EXAFS results show the formation of small microcrystallites with the incipient cassiterite structure. The formation of an ordered (crystalline) phase during isothermal sintering of SnO2 monolithic xerogels, at 200, 250, 300, 400, 500, 600 and 700☌, has been analyzed by the combined use of EXAFS and XRD techniques. The surface morphology of SnO 2 films was analyzed by the scanning electron microscopic (SEM) studies. X-ray diffraction (XRD) was employed to find the crystallite size by using Debye Scherrer’s formula. EXAFS and XRD study of the structural evolution during isothermal sintering of SnO2 xerogels EXAFS and XRD study of the structural evolution during isothermal sintering of SnO2 xerogelsīrito, G. Abstract The chemical bath deposition (CBD) technique was used for the synthesis of the tin oxide (SnO 2) thin films.
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